Original document(20 pages)  中文版
    The present invention relates to an apparatus and method for cleaning post-etch semiconductor wafers (230) using ultra-pure dry steam.
Application Number
申请号
99804744 Application Date
申请日
1999.02.23
Title 名称 Apparatus and method for cleaning semiconductor wafers
Publication Number
公开号
1295504 Publication Date
公开日
2001.05.16
Approval Pub. Date Granted Pub. Date
International Classification 分类号 B08B3/00;F26B21/00;F26B21/06
Applicant(s) Name
申请人
Gamma Precision Technology, Inc.
Address 地址
Inventor(s) Name 发明人 Masato Toshima
Attorney & Agent 代理人 liu xiaofeng

  
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Multi-metal oxide compounds with two-phase structure
Multi-metal oxide material with two-phase structure
Ion exchanged aluminium-magnesium or fluorinated magnesium silicate aerogels and catalyst supports therefrom
Distributor assembly
Internal batch mixing machines and rotors
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